回收工廠閑置/倒閉電子儀器，個(gè)人處理儀器，歡迎來(lái)電??！
本公司長(zhǎng)期專業(yè)銷售、租賃、維修、計(jì)量、回收高頻二手儀器！
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二手儀器回收/陳衛(wèi)平
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手機(jī): 13549336060/13378604435
QQ客服：742002535
阿里旺旺:chenweipin1987
電話: 0769 - 82134961
地址:廣東東莞市塘廈鎮(zhèn)塘廈
本公司長(zhǎng)期回收/銷售/維修/憑租儀器:音頻儀器,視頻儀器,高頻儀器(如網(wǎng)絡(luò)分析儀,頻譜分析儀高頻信號(hào)源,無(wú)線電綜合測(cè)試儀等高頻儀器,并高頻承接儀器維修)!
The company long-term recovery/sales/maintenance/by renting equipment: audio equipment, video equipment, high frequency instrument (such as network analyzer, spectrum analyzer, the high frequency signal source, radio high frequency equipment, such as general tester and high frequency receiving apparatus maintenance)!
E4448A PSA 頻譜分析儀，3 Hz - 50 GHz
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（E4448A回收）主要特性與技術(shù)指標(biāo)
（E4448A回收）性能
（E4448A回收）+/-0.19 dB 絕對(duì)幅度精度
（E4448A回收）154 dBm 顯示平均噪聲電平（DANL）
（E4448A回收）10 kHz 偏置時(shí)的相噪：-118 dBc/Hz
（E4448A回收）81 dB W-CDMA ACLR 動(dòng)態(tài)范圍
（E4448A回收）分析帶寬
（E4448A回收）10 MHz 分析帶寬（用于基本模式的選件 B7J）
（E4448A回收）可選 40 或 80 MHz 分析帶寬，以便捕捉和測(cè)量復(fù)雜信號(hào)。觀看演示
（E4448A回收）適用于 40 或 80 MHz 分析帶寬的 -78 dB（額定值）三階互調(diào)
（E4448A回收）適用于校準(zhǔn)后的 VSA 測(cè)量的 300 MHz 分析帶寬
（E4448A回收）靈活性
（E4448A回收）靈活的平臺(tái)，包含 16 個(gè)可選且易于使用的內(nèi)置測(cè)量專用軟件和硬件選（E4448A回收）件標(biāo)配 PowerSuite 一鍵式功率測(cè)量
（E4448A回收）通用數(shù)據(jù)分析、可視化、計(jì)量自動(dòng)化的數(shù)據(jù)分析軟件 MATLAB。PSA 系（E4448A回收）列 MATLAB軟件
（E4448A回收）描述
（E4448A回收）E4448A PSA 高性能頻譜分析儀可測(cè)量和監(jiān)測(cè)頻率高達(dá) 50 GHZ的復(fù)雜射（E4448A回收）頻、微波和毫米波信號(hào)。使用外混頻選件可進(jìn)一步擴(kuò)展頻率范圍：使用（E4448A回收）安捷倫外混頻器時(shí)可達(dá)到 110 GHz；使用其他廠商的混頻器時(shí)可達(dá)到 （E4448A回收）325 GHz。
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E4400系列：
E4401A，E4401B，E4403A，E4404A，E4405A，E4406A，E4407A，E4408A，
E4402B，E4411B，E4408B，E4411A，E4403B，E4404B，E4406B，E4405B，E4407B
E4440系列：
E4443A，E4443B，E4440B，E4445A，E4445B，E4448A，E4446A，E4440A，
E4447A，
E7400系列：
E7405A，E7403A，E7404A，E7401A，E7402A
N9300系列：
N9320A，N9320B，N9340B，N9340A，N9342C，N9010A，N9020A，N9030A
R3132A，R3361C，R3261C，R3131，HM5010，HM5011，
HM5012，HM5014，HM5510，HM5511，SA970，SA-930，
MD1620C，MS2661A，PSA-3000，SA7270A，SA7270
R3265，R3267，MS2665C，MS2667C，MS2721B，R3465A，
R4131D，MS2711A，
Rapid growth in satellite and wireless communications markets has contributed to the need for improved overall system performance which, in turn, applies pressure to improve the noise figure measurement and performance of subsystems and their components.
To do this accurately, it is necessary to understand how a number of variables affect the overall measurement uncertainty. For measurements with an analyzer that measures noise figure, the measurement system contributors typically include:
the analyzer itself
the noise source
the characteristics of the device under test (DUT)
These factors interact in a complex way, but the overall measurement uncertainty can be modeled. The purpose of our 'Noise Figure Uncertainty Calculator' is to provide the measurement uncertainty associated with a particular DUT based on its characteristics and the specifications of the measurement system. For the model to be accurate in the Y-factor measurement technique case, the DUT must have reasonable reverse isolation, so that mismatch on one port does not drastically affect the impedance seen at the other port. For a more complete analysis refer to the article "Calculate the Uncertainty of NF Measurements", written by Duncan Boyd, Microwaves & RF October 1999, pp.93-102.